Eumetrys has been awarded the global exclusive distribution of the YPI – Clear Scanner manufactured by Japanese company YGK.
This laser scanning particle inspection tool for un-patterned compound semiconductor substrates greatly enhanced the quality control of semiconductors by inspecting the surface of various opaque and transparent wafers, including silicon carbide (SiC), gallium nitride (GaN), indium phosphide (InP), Sapphire, gallium arsenide (GaAs), silicon, and glass. Defective silicon wafers could cost the global semiconductor industry between $10 and $20 billion annually, depending on yield rates, technology nodes, and fab efficiency.
Key functionalities include:
- Unmatched substrate flexibility – compatible with transparent, semi-transparent, and opaque wafers ranging from two to 12 inches, including thin and bowed wafers
- Advanced surface inspection capabilities – detects particles, haze, scratches, and area defects with high precision. Optimised for transparent substrates to ensure effective quality control on cutting-edge wafer types
- Robust and proven engineering for longevity – built with standard components and a solid mechanical design, ensuring low total cost of ownership and reliable long-term operation backed by over 30 years of expertise
- Optimised cost efficiency and uptime – engineered for high throughput and best-in-class uptime, its streamlined conception and low maintenance needs help fabs meet financial targets and maximise productivity
“We are proud to add this competitively priced scanner to our current product range of turnkey solutions for semiconductor fabs,” explains Yannick Bedin, CEO of Eumetrys. “Wafer default inspection is a crucial step in the manufacturing process to ensure utmost quality and yield. With this reliable and fully customisable scanner developed specifically for the compound semiconductor market, chip makers can quickly respond to the stringent quality standards dictated by increasingly complex manufacturing processes.”
